Semiconductor Testing

Photon Systems Deep UV lasers and photoluminescence/Raman spectrometers are used in labs worldwide for the measurement and analysis of semiconductors.

Silicon wafer with processor cores isolated on white background

Key Issues

  • Short Wavelength Required

    Laser excitation needs to have a higher energy than the bandgap of the material being studied.

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Wide Bandage Semiconductor Photoluminescence Testing

With photon energies of 5.0 or 5.5eV, the Mini PL/Raman is the perfect tool for wide bandgap semiconductor photoluminescence testing.

Optical Beam Induced Current

Optical Beam Induced Current is a semiconductor failure analysis technique which is used to locate damaged junctions, buried diffusion regions and gate oxide shorts.

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1512 Industrial Park St. Covina, CA 91722-3417

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626 967-6431

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