Semiconductor Testing

Photon Systems Deep UV lasers and photoluminescence/Raman spectrometers are used in labs worldwide for the measurement and analysis of semiconductors.

Silicon wafer with processor cores isolated on white background

Key Issues

  • Short Wavelength Required

    Laser excitation needs to have a higher energy than the bandgap of the material being studied.


Wide Bandgap Semiconductor Photoluminescence Testing

With photon energies of 5.0 or 5.5eV, the Mini PL 110 is the perfect tool for wide bandgap semiconductor photoluminescence testing.

Optical Beam Induced Current

Optical Beam Induced Current is a semiconductor failure analysis technique which is used to locate damaged junctions, buried diffusion regions and gate oxide shorts.

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